A light source device used for performance testing (inspection) of semiconductors.
This is a light source device used for performance testing (inspection) of semiconductor image sensors such as CCD and CMOS types, area sensors, linear sensors, and near-infrared sensors.
The light source device is used in conjunction with test systems for pre-manufacturing tests (electrical characteristic tests of wafers), post-manufacturing tests (electrical function tests of packages), and R&D evaluation tests.
It is compatible with various test systems, supports 300mm wafers, is suitable for low illumination, and excels in color temperature management.
【Features】
■ Light source device used for performance testing (inspection) of semiconductors
→ CCD and CMOS type image sensors, area sensors, linear sensors, near-infrared sensors, etc.
■ Used in connection with test system devices
→ Pre-manufacturing tests (electrical characteristic tests of wafers)
→ Post-manufacturing tests (electrical function tests of packages)
→ R&D evaluation tests, etc.
*For more details, please refer to the PDF document or feel free to contact us.